Aberration-Corrected Electron Microscopy for Nanocarbon Materials
نویسندگان
چکیده
منابع مشابه
Aberration-Corrected Electron Microscopy of Nanoparticles
The very rich history of electron microscopy started with the discovery of the duality wave–particle. In the 1920s, the beginning of the twentieth century, it was shown that electrons could also behave as a wave. The optical microscopy based on Abbe’s theory already achieved the resolution limit ~ / ~ , λ 2 2 500Å. The electrons are located at high voltages and hence will have much shorter wave...
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The attainable specimen resolution is determined by the instrumental resolution limit d(i) and by radiation damage. Solid objects such as metals are primarily damaged by atom displacement resulting from knock-on collisions of the incident electrons with the atomic nuclei. The instrumental resolution improves appreciably by means of aberration correction. To achieve atomic resolution at voltages...
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ژورنال
عنوان ژورنال: Journal of the Vacuum Society of Japan
سال: 2011
ISSN: 1882-4749,1882-2398
DOI: 10.3131/jvsj2.54.264